Optimization of Si/SiGe HBT Architecture Integrated in 28-nm FD-SOI BiCMOS Technology. Iraqi Journal of Applied Physics, [S. l.], v. 22, n. 1, p. 145–152, 2025. DOI: 10.2025/9fsy7g17. Disponível em: http://ijap-iq.com/index.php/ijap/article/view/448. Acesso em: 17 apr. 2026.