Formation and Structural Characterization of Cu15Si4 Thin Films on Si(111) by RFMS and DCMS Magnetron Sputtering. Iraqi Journal of Applied Physics, [S. l.], v. 22, n. 3, p. 499–503, 2026. DOI: 10.2025/fcn57n46. Disponível em: https://ijap-iq.com/index.php/ijap/article/view/545. Acesso em: 15 aug. 2026.