Fabrication and Optoelectronic Properties of Bismuth Oxide Thin Films Prepared by Thermal Evaporation
DOI:
https://doi.org/10.2025/z62csh60Abstract
This work shows the fabrication of Bi2O3/Si heterojunctions for solar cell applications. Bi2O3 nanoparticles were deposited on quartz, n- and p-type silicon substrates by thermal evaporation method. The structural and optical characteristics of the prepared Bi2O3 thin films were studied. The polycrystalline structure of these thin films was revealed with (111) direction. These Bi2O3 thin film has direct energy gap of 2.6 eV. The electrical measurements under dark and light conditions indicate a significant improvement conversion efficiency values for Al/n-Bi2O3/n-Si/Al heterojunction. The growth of the depletion layer width with the built-in potential was the cause of the decrease in device capacitance. The photovoltaic measurements were determined and the results showed that the Bi2O3/n-Si sample was the best.