Calculation of Electric Field Generated by Mechanical Stress in Bi1.8Pb0.2Sr2Ca2Cu3-xZnxO Superconducting Thin Films
DOI:
https://doi.org/10.2025/n36xq669Abstract
The mechanical properties of the Bi1.8Pb0.2Sr2Ca2Cu3-x ZnxO superconducting film was studied through Shear force tests as a function of displacement at different Zn concentrations (x=0.2, 0.4, 0.6, 0.8, 1). The examinations were carried out at Tehran Technological university the tests showed that the higher the Zn concentrations , the greater the strength of the sample to withstand the pressures, the break points of the sample were recorded at the maximum shear forces (2.5, 3, 5.7, 5.8, 6.5 N) the corresponding concentrations Znx is (x=0.2,0.4,0.6,0.8,1) respectively. The electrical properties of samples ,were measured by four probe technique ,the values of TC for variable Zn concentrations in Bi1.8Pb0.2Sr2Ca2Cu3-xZnxO thin film recorded (90,95 ,97,102)and superconducting behavior respectively. Bi1.8Pb0.2Sr2Ca2Cu3-xZnxO superconducting film samples were prepared by pulsed laser deposition PLD. Theoretically, we studied some of the mechanical properties in more depth and based on the results of experimental tests of shear force (0.5, 1, 1.5, 2, 2.5, 3 , 3.5, 4 , 5 , 5.7 , 5.8 , 6 ,6.5)N two stresses were calculated the first is the true stress σtru , which the sample fracture occurred and was calculated from the ratio of the force perpendicular to the cross-sectional area of the film and the second is the geometric stress σgE from the force ratio applied to the film area, also the work done W to displace the perovskite lattice layers and the electric field E generated by the effect of true stress σtru between the layers Finally ,a model of the perovskite lattice Bi1.8 Pb0.2Sr2Ca2Cu3-xZnO is constructed showing the deformation caused by stress (piezoelectric deformation ).