AP0995 Preparation and Analysis of Lead Copper Sulfide Thin Film Heterojunctions Using Vacuum Thermal Deposition

Abstract

This study investigates the structural, optical, and electrical properties of PbS/CuS composite thin films prepared via vacuum thermal evaporation on (111)-oriented single-crystal Si substrates of both p-type and n-type. XRD revealed a polycrystalline cubic structure with increased crystallite size. AFM confirmed uniform surface distribution, while FESEM showed nanostructured morphology. Optical absorbance decreased with higher additive ratios, suggesting a transition toward an amorphous-like structure. Hall effect measurements indicated p-type conductivity dominated by holes. I-V and C-V analyses were performed for the P-(PbS/CuS)/P-Si and P-(PbS/CuS)/N-Si heterojunctions.